Nanopositioning for Microscopy

Fast – Compact – To the Nanometer

Precision positioning is the key element in all types of microscopy. High-resolution microscopy must be capable of accurate and reproducible positioning of imaging elements and samples. Requirements range from Z focus positioning of the objective to coarse and fine positioning of the sample in X, Y, and Z direction as well as often in θX and θY direction and sometimes even in θZ. PI meets these requirements with a broad product portfolio for inverse microscope systems of all major manufacturers.

Coarse and Fine Positioning Sample Stages

  • U-780 PILine® XY Stage System with Controller and Joystick
    • High-resolution piezo linear drive
    • Self-locking at rest | Low noise
    • Highest stability due to low thermal load and no lubricants
    • Large dynamics range of 10 µm/s to 120 mm/s
    • Travel range to 135 mm x 85 mm
    • Compatible with a wide range of sample holders
  • Large selection of fine positioning stages for positioning of samples (sample holders) in the nanometer range
    • Positioning with (sub)nanometer precision in one (Z) direction or in many DOFs; depending on the model and requirements
    • Wide variety of travel ranges and speed

PIFOC® Objective Scanners: Focusing and Z-Stack Scanning with Nanometer Precision

  • With a wide range of PIFOC® lens scanners, PI provides the ability to do just the experiment / sample analysis you want to perform.
  • Latest developments comprise the newly designed PIFOC® P-725.1CDE2 with improved settling times.

Further Applications

Applications for the Sample Positioning Stages

Further Applications for the PIFOC® Scanner

Recommended Pages



Nanopositioning for Microscopy

Fast, Compact, to the Nanometer

Version / Date
pdf - 8 MB
Version / Date
BRO28CN 2018-12
pdf - 15 MB
White Paper

PI Ultra-High Resolution Microscopy

Ultra-High-Resolution Microscopy in a Modular System

Version / Date
WP pi1114
pdf - 971 KB
Version / Date
WP pi1114
pdf - 969 KB