Tag: Piezo

Precision Positioning of Samples and Objectives

The Key to Successful Microscoping

Whether classical stereo microscopy, fluorescent, widefield or laser scanning microscopy, whether SEM, FIB-SEM, TEM, AFM or correlative microscopy - positioning samples and objectives with subnanometer precision is decisive for the quality of your results with all of these techniques. This fully clickable, new “Nanopositioning for Microscopy” brochure provides a comprehensive overview of objective...


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Precision Motion and Positioning due to High-Resolution Measuring Technology

External Interferometer vs. Internal Sensor

Read more on „Controlling PI Positioners with External Zygo Interferometer“ in the new whitepaper!


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Positioning Heavy Loads with Nanometer Precision over Long Travel Ranges

Is That Feasible?

Hybrid drives combine two different drive concepts into a high-performance and precision positioning system. They take advantage of both drives. These types of solutions are always in demand when one drive alone is not in a position to meet all of the requirements of applications. An example of this is nanometer-precision positioning of heavy loads over long travel ranges. Nanopositioning systems...


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