Tag: Piezo

Precision Positioning of Samples and Objectives

The Key to Successful Microscoping

Whether classical stereo microscopy, fluorescent, widefield or laser scanning microscopy, whether SEM, FIB-SEM, TEM, AFM or correlative microscopy - positioning samples and objectives with subnanometer precision is decisive for the quality of your results with all of these techniques. This fully clickable, new “Nanopositioning for Microscopy” brochure provides a comprehensive overview of objective scanners and sample stages with up to six degrees of motion freedom – illustrated by a variety of today’s microscopy techniques.

Learn more

Precision Motion and Positioning due to High-Resolution Measuring Technology

External Interferometer vs. Internal Sensor

Read more on „Controlling PI Positioners with External Zygo Interferometer“ in the new whitepaper!

Learn more

Positioning Heavy Loads with Nanometer Precision over Long Travel Ranges

Is That Feasible?

Hybrid drives combine two different drive concepts into a high-performance and precision positioning system. They take advantage of both drives. These types of solutions are always in demand when one drive alone is not in a position to meet all of the requirements of applications. An example of this is nanometer-precision positioning of heavy loads over long travel ranges. Nanopositioning systems that combine piezo drives with classical drive screws therefore offer a practical solution, but also other drive concepts are possible.

Learn more